EMC basic test standards

As with many technical disciplines, EMC is very complex and hence trying to define all the parameters, tests and limits into a single test standard would be very difficult. To overcome this and to provide some consistency across all product standards a hierarchy of standards is been developed. The diagram below illustrates this in the case of the information technology EMC standard for immunity (EN55024). The product specific standard is the one that a manufacturer complies with however it references a number of ‘basic’ test standards for the test methods, limits and phenomena.

EMC test standards

In the case of EMC, there are many basic EMC standards. It is the job of the product standard to identify the phenomena that is relevant to that product group's environment and then reference the basic standard and appropriate limits. The table below indicates the current list of EMC basic standards. The basic standards are important to manufacturers and test labs alike for different reasons. Manufacturers need to keep a watching brief on what is being developed within the basic standard since it will have a long term impact on the design of products whilst test labs need to ensure that they are equipped with the appropriate test equipment and facilities when the product family standards make reference to the basic standards' methods.

The date of approval (DoA) is the date it was approved as an international standard whilst the DoP is the date of publication and that which National administrations either have to endorse or publish an identical national version. The Date of Withdrawal (DoW) is that latest date that any conflicting standard has to be withdrawn.

EN61000-4-x basic EMC test standards list

(Current as of 28th January 2010) 

Standard No Scope Amend-ment(s) DoA DoP DoW
EN61000-4-1:2007 Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Overview of IEC 61000-4 Series - 01/11/2007 01/11/2007 01/02/2010
EN61000-4-2:2009 Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Electrostatic Discharge Immunity Test - 01/03/2009 31/05/2009 01/03/2012
EN61000-4-3:2006   Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Radiated Radio- Frequency, Electromagnetic Field Immunity Test - 01/03/2006 01/12/2006 01/03/2009
A1:2008 30/05/2008 01/11/2008 01/02/2011
EN61000-4-4:2004 Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Electrical Fast Transient/Burst Immunity Test - 01/10/204 01/07/2005 01/10/2007
EN61000-4-5:2006 Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Surge Immunity Test - 01/10/2006 01/07/2007 01/10/2009
EN61000-4-6:2009 Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Immunity to Conducted Disturbances, Induced by Radio-Frequency Fields - 01/03/2009 31/05/2009 01/03/2012
EN61000-4-7:2002 Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - General Guide on Harmonics and Interharmonics Measurements and Instrumentation, for Power Supply Systems and Equipment Connected Thereto - 01/10/2002 01/07/2003 01/10/2005
A1:2009   01/03/2009
30/06/2009
01/03/2012
EN61000-4-8:1994   Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Power Frequency Magnetic Field Immunity Test - 16/06/1992 01/06/1994 01/06/1994
A1:2001 01/09/2001  01/09/2001 01/12/2003
EN61000-4-9:1994   Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Pulse Magnetic Field Immunity Test - 16/06/1992 01/06/1994 01/06/1994
A1:2001 01/12/2000 01/09/2001 01/12/2003
EN61000-4-10:1994   Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Damped Oscillatory Magnetic Field Immunity Test - 16/06/1992 01/06/1994 01/06/1994
A1:2001 01/12/2000 01/09/2001 01/12/2003
EN61000-4-11:2004
Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Voltage Dips, Short Interruptions and Voltage Variations Immunity Tests -
01/06/2004 01/03/2005 01/06/2007
EN61000-4-12:2006
Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Ring Wave Immunity Test - 01/11/2006 01/08/2007 01/11/2009
EN61000-4-13:2002 Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Harmonics and Inter-harmonics Including Mains Signalling at A.C. Power Port, Low Frequency Immunity Tests - 01/05/2002 01/02/2003 01/05/2005
EN61000-4-14:1999   Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Voltage Fluctuation Immunity Test - 01/04/1999 01/10/2000 01/04/2002
A1:2004 01/05/2004 01/05/2005 01/05/2007
EN61000-4-15:1998   Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Flickermeter, Functional and Design Specifications - 01/04/1998 01/01/1999 01/01/2001
A1:2003 01/03/2003 01/12/2003 01/03/2006
EN61000-4-16:1998   Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Test for Immunity to Conducted, Common Mode Disturbances in the Frequency Range 0 Hz to 150 kHz - 01/01/1998 01/10/1998 01/10/1998
A1:2004 01/05/2004 01/05/2005 01/05/2007
EN61000-4-17:1999   Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Ripple on D.C. Input Power Port Immunity Test - 01/08/1999 01/05/2000 01/08/2002
A1:2004 01/05/2004 01/05/2005 01/05/2007
EN61000-4-18:2007 Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Damped Oscillatory Wave Immunity Test - 01/03/2007 01/12/2007 01/03/2010
EN61000-4-20:2003   Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Emission and Immunity Testing in Transverse Electromagnetic (TEM) Waveguides - 01/04/2003 01/01/2004 01/04/2006
A1:2007 01/06/2007 01/03/2008 01/06/2010
EN61000-4-21:2003 Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Reverberation Chamber Test Methods - 01/07/2004 01/07/2004 01/10/2006
EN61000-4-23:2001 Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Test Methods for Protective Devices for HEMP and other Radiated Disturbances - 01/11/2000 01/08/2001 01/11/2003
EN61000-4-24:1997 Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Test Methods for Protective Devices for HEMP Conducted Disturbance - 11/03/1997 01/12/1997 01/12/1997
EN61000-4-25:2002 Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - HEMP Immunity Test Methods for Equipment and Systems - 05/03/2002 01/12/2002 01/03/2005
EN61000-4-27:2001 Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Unbalance, Immunity Test - 01/06/2001 01/06/2001 01/09/2003
EN61000-4-28:2000   Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Variation of Power Frequency, Immunity Test - 01/01/2000 01/10/2000 01/01/2003
A1:2004 01/04/2004 01/05/2005 01/05/2007
EN61000-4-29:2001 Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Voltage Dips, Short Interruptions and Voltage Variations on D.C. Input Power Port Immunity Tests - 01/11/2000 01/08/2001 01/11/2003
EN61000-4-30:2003 Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Power Quality Measurement Methods - 01/12/2008 30/04/2009 01/12/2011
IEC61000-4-32:2002 Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - High-Altitude Electromagnetic Pulse (HEMP) Simulator Compendium - - - -
IEC61000-4-33:2005 Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Measurement Methods for High Power Transient Parameters - - - -
EN61000-4-34:2007 Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Voltage Dips, Short Interruptions and Voltage Variations Immunity Tests for Equipment with Input Current more than 16A Per Phase - 01/04/2007 01/01/2008 01/04/2010
Note(s)
a) DOA refers to "Date of Approval" by CENELEC (European Committee for Electrotechnical Standardisation).
b) DOP refers to "Date of Publication" of the reference standard.
c) DOW refers to "Date of Withdrawal" of the superseded standard, where presumption of conformity expires and to which compliance with the new standard, becomes a legal requirement.
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