EMC basic test standards
As with many technical disciplines, EMC is very complex and hence trying to define all the parameters, tests and limits into a single test standard would be very difficult. To overcome this and to provide some consistency across all product standards a hierarchy of standards is been developed. The diagram below illustrates this in the case of the information technology EMC standard for immunity (EN55024). The product specific standard is the one that a manufacturer complies with however it references a number of ‘basic’ test standards for the test methods, limits and phenomena.
In the case of EMC, there are many basic EMC standards. It is the job of the product standard to identify the phenomena that is relevant to that product group's environment and then reference the basic standard and appropriate limits. The table below indicates the current list of EMC basic standards. The basic standards are important to manufacturers and test labs alike for different reasons. Manufacturers need to keep a watching brief on what is being developed within the basic standard since it will have a long term impact on the design of products whilst test labs need to ensure that they are equipped with the appropriate test equipment and facilities when the product family standards make reference to the basic standards' methods.
The date of approval (DoA) is the date it was approved as an international standard whilst the DoP is the date of publication and that which National administrations either have to endorse or publish an identical national version. The Date of Withdrawal (DoW) is that latest date that any conflicting standard has to be withdrawn.
EN61000-4-x basic EMC test standards list
(Current as of 28th January 2010)
| Standard No | Scope | Amend-ment(s) | DoA | DoP | DoW |
|---|---|---|---|---|---|
| EN61000-4-1:2007 | Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Overview of IEC 61000-4 Series | - | 01/11/2007 | 01/11/2007 | 01/02/2010 |
| EN61000-4-2:2009 | Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Electrostatic Discharge Immunity Test | - | 01/03/2009 | 31/05/2009 | 01/03/2012 |
| EN61000-4-3:2006 | Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Radiated Radio- Frequency, Electromagnetic Field Immunity Test | - | 01/03/2006 | 01/12/2006 | 01/03/2009 |
| A1:2008 | 30/05/2008 | 01/11/2008 | 01/02/2011 | ||
| EN61000-4-4:2004 | Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Electrical Fast Transient/Burst Immunity Test | - | 01/10/204 | 01/07/2005 | 01/10/2007 |
| EN61000-4-5:2006 | Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Surge Immunity Test | - | 01/10/2006 | 01/07/2007 | 01/10/2009 |
| EN61000-4-6:2009 | Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Immunity to Conducted Disturbances, Induced by Radio-Frequency Fields | - | 01/03/2009 | 31/05/2009 | 01/03/2012 |
| EN61000-4-7:2002 | Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - General Guide on Harmonics and Interharmonics Measurements and Instrumentation, for Power Supply Systems and Equipment Connected Thereto | - | 01/10/2002 | 01/07/2003 | 01/10/2005 |
| A1:2009 |
01/03/2009 |
30/06/2009 |
01/03/2012 |
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| EN61000-4-8:1994 | Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Power Frequency Magnetic Field Immunity Test | - | 16/06/1992 | 01/06/1994 | 01/06/1994 |
| A1:2001 | 01/09/2001 | 01/09/2001 | 01/12/2003 | ||
| EN61000-4-9:1994 | Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Pulse Magnetic Field Immunity Test | - | 16/06/1992 | 01/06/1994 | 01/06/1994 |
| A1:2001 | 01/12/2000 | 01/09/2001 | 01/12/2003 | ||
| EN61000-4-10:1994 | Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Damped Oscillatory Magnetic Field Immunity Test | - | 16/06/1992 | 01/06/1994 | 01/06/1994 |
| A1:2001 | 01/12/2000 | 01/09/2001 | 01/12/2003 | ||
|
EN61000-4-11:2004
|
Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Voltage Dips, Short Interruptions and Voltage Variations Immunity Tests |
- |
01/06/2004 | 01/03/2005 | 01/06/2007 |
|
EN61000-4-12:2006
|
Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Ring Wave Immunity Test | - | 01/11/2006 | 01/08/2007 | 01/11/2009 |
| EN61000-4-13:2002 | Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Harmonics and Inter-harmonics Including Mains Signalling at A.C. Power Port, Low Frequency Immunity Tests | - | 01/05/2002 | 01/02/2003 | 01/05/2005 |
| EN61000-4-14:1999 | Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Voltage Fluctuation Immunity Test | - | 01/04/1999 | 01/10/2000 | 01/04/2002 |
| A1:2004 | 01/05/2004 | 01/05/2005 | 01/05/2007 | ||
| EN61000-4-15:1998 | Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Flickermeter, Functional and Design Specifications | - | 01/04/1998 | 01/01/1999 | 01/01/2001 |
| A1:2003 | 01/03/2003 | 01/12/2003 | 01/03/2006 | ||
| EN61000-4-16:1998 | Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Test for Immunity to Conducted, Common Mode Disturbances in the Frequency Range 0 Hz to 150 kHz | - | 01/01/1998 | 01/10/1998 | 01/10/1998 |
| A1:2004 | 01/05/2004 | 01/05/2005 | 01/05/2007 | ||
| EN61000-4-17:1999 | Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Ripple on D.C. Input Power Port Immunity Test | - | 01/08/1999 | 01/05/2000 | 01/08/2002 |
| A1:2004 | 01/05/2004 | 01/05/2005 | 01/05/2007 | ||
| EN61000-4-18:2007 | Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Damped Oscillatory Wave Immunity Test | - | 01/03/2007 | 01/12/2007 | 01/03/2010 |
| EN61000-4-20:2003 | Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Emission and Immunity Testing in Transverse Electromagnetic (TEM) Waveguides | - | 01/04/2003 | 01/01/2004 | 01/04/2006 |
| A1:2007 | 01/06/2007 | 01/03/2008 | 01/06/2010 | ||
| EN61000-4-21:2003 | Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Reverberation Chamber Test Methods | - | 01/07/2004 | 01/07/2004 | 01/10/2006 |
| EN61000-4-23:2001 | Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Test Methods for Protective Devices for HEMP and other Radiated Disturbances | - | 01/11/2000 | 01/08/2001 | 01/11/2003 |
| EN61000-4-24:1997 | Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Test Methods for Protective Devices for HEMP Conducted Disturbance | - | 11/03/1997 | 01/12/1997 | 01/12/1997 |
| EN61000-4-25:2002 | Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - HEMP Immunity Test Methods for Equipment and Systems | - | 05/03/2002 | 01/12/2002 | 01/03/2005 |
| EN61000-4-27:2001 | Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Unbalance, Immunity Test | - | 01/06/2001 | 01/06/2001 | 01/09/2003 |
| EN61000-4-28:2000 | Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Variation of Power Frequency, Immunity Test | - | 01/01/2000 | 01/10/2000 | 01/01/2003 |
| A1:2004 | 01/04/2004 | 01/05/2005 | 01/05/2007 | ||
| EN61000-4-29:2001 | Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Voltage Dips, Short Interruptions and Voltage Variations on D.C. Input Power Port Immunity Tests | - | 01/11/2000 | 01/08/2001 | 01/11/2003 |
| EN61000-4-30:2003 | Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Power Quality Measurement Methods | - | 01/12/2008 | 30/04/2009 | 01/12/2011 |
| IEC61000-4-32:2002 | Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - High-Altitude Electromagnetic Pulse (HEMP) Simulator Compendium | - | - | - | - |
| IEC61000-4-33:2005 | Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Measurement Methods for High Power Transient Parameters | - | - | - | - |
| EN61000-4-34:2007 | Electromagnetic Compatibility (EMC) - Testing and Measurement Techniques - Voltage Dips, Short Interruptions and Voltage Variations Immunity Tests for Equipment with Input Current more than 16A Per Phase | - | 01/04/2007 | 01/01/2008 | 01/04/2010 |
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Note(s) a) DOA refers to "Date of Approval" by CENELEC (European Committee for Electrotechnical Standardisation). b) DOP refers to "Date of Publication" of the reference standard. c) DOW refers to "Date of Withdrawal" of the superseded standard, where presumption of conformity expires and to which compliance with the new standard, becomes a legal requirement. |
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